System Maintenance Notice

Please note that maintenance work is scheduled between 4 AM and 5 AM - CET. During this time, you may experience reduced performance. Thanks for your patience.

Publications

Journal Article Epublish 4 citations

PubMed: 38675348 DOI: 10.3390/mi15040537

Extending the Depth of Focus of an Infrared Microscope Using a Binary Axicon Fabricated on Barium Fluoride.

Micromachines (Basel) 15(4)

Authors: Molong Han, Daniel Smith, Tauno Kahro, Dominyka Stonytė, Aarne Kasikov, Darius Gailevičius, Vipin Tiwari, Agnes Pristy Ignatius Xavier, Shivasubramanian Gopinath, Soon Hock Ng, Aravind Simon John Francis Rajeswary, Aile Tamm, Kaupo Kukli, Keith Bambery, Jitraporn Vongsvivut, Saulius Juodkazis, Vijayakumar Anand

Affiliations

  • Optical Sciences Centre and ARC Training Centre in Surface Engineering for Advanced Materials (SEAM), School of Science, Computing and Engineering Technologies, Swinburne University of Technology, Hawthorn, VIC 3122, Australia.
  • Institute of Physics, University of Tartu, 50411 Tartu, Estonia.
  • Laser Research Center, Physics Faculty, Vilnius University, Sauletekio Ave. 10, 10223 Vilnius, Lithuania.
  • Institute of Physics, University of Tartu, 50411 Tartu, Estonia. School of Electrical and Computer Engineering, Ben Gurion University of the Negev, P.O. Box 653, Beer-Sheva 8410501, Israel.
  • Infrared Microspectroscopy (IRM) Beamline, ANSTO-Australian Synchrotron, Clayton, VIC 3168, Australia.
  • Tokyo Tech World Research Hub Initiative (WRHI), School of Materials and Chemical Technology, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo 152-8550, Japan.

Abstract

Axial resolution is one of the most important characteristics of a microscope. In all microscopes, a high axial resolution is desired in order to discriminate information efficiently along the longitudinal direction. However, when studying thick samples that do not contain laterally overlapping information, a low axial resolution is desirable, as information from multiple planes can be recorded simultaneously from a single camera shot instead of plane-by-plane mechanical refocusing. In this study, we increased the focal depth of an infrared microscope non-invasively by introducing a binary axicon fabricated on a barium fluoride substrate close to the sample. Preliminary results of imaging the thick and sparse silk fibers showed an improved focal depth with a slight decrease in lateral resolution and an increase in background noise.

Cited by