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Journal Article Epublish 19 citations

PubMed: 32206398 DOI: 10.1364/BOE.380845

Inverse scattering for reflection intensity phase microscopy.

Biomed Opt Express 11(2):911-926

Authors: Alex Matlock, Anne Sentenac, Patrick C Chaumet, Ji Yi, Lei Tian

Affiliations

  • Department of Electrical and Computer Engineering, Boston University, Boston, MA 02215, USA.
  • Institut Fresnel, Aix Marseille Univ. CNRS, Centrale Marseille, Marseille, France.
  • Department of Medicine, Boston University School of Medicine, Boston, MA 02215, USA.

Abstract

Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from -only measurements under diverse illumination. We evaluate the forward and inverse scattering model based on the first Born approximation for imaging scattering objects above a glass slide. Under this design, the measured field combines forward-scattering and height-dependent back-scattering from the object that complicates object phase recovery. Using only the forward-scattering, we derive a linear inverse scattering model and evaluate this model's validity range in simulation and experiment using a standard reflection microscope modified with a programmable light source. Our method provides enhanced contrast of thin, weakly scattering samples that complement transmission techniques. This model provides a promising development for creating simplified intensity-based reflection quantitative phase imaging systems easily adoptable for biological research.

MeSH

Microscopy

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